High-resolution silicon K/3 X-ray spectra and crystal structure
نویسنده
چکیده
High-resolution X-ray emission spectra (XES) are presented for minerals with a variety of structures. The participation of the Si 3p orbitals in bonding is influenced by the local structure around the silicon atom. In orthosilicates the distortion of the SiO44--tetrahedron influences both peak-width and the intensity of the high-energy shoulder of the Si-Kfl spectrum. In minerals containing Si-O-Si bonds there is mixing of the Si 3s and 3p orbitals giving rise to a peak on the low-energy side of the main Si-K/3 peak. When combined with X-ray photoelectron spectra (XPS), a complete molecular orbital picture of bonding can be established.
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